PSA-24 Invited Speakers

Plenary Lectures

Dr.  Donald Baer	Prof.  Ian Gilmore	Dr.  Sung-Chan Jo
A Perspective on XPS Challenges, Needs and Opportunitie	Evolution and Revolution in SecondaryIon Mass Spectrometry	Advanced Surface Analysis for the Perspective in Display/Semiconductor Industry
Pacific Northwest National Laboratory	National Physical Laboratory (NPL)	Samsung Display

1. Standardization and Pre-standardization

Dr.  David Cant	Prof.  Hidehiko NONAKA	Dr.  Wonja Min	Dr.  Seung Mi Lee
A Roadmap to HAXPES Standardisation	Standardization Activities in ISO TC 201 (Surface Chemical Analysis)	Standardization of Medium Energy Ion Scattering Spectrometry	Quantitative Analysis of Binary Alloy Films by Surface Analysis Methods in CCQM-SAWG
National Physical Laboratory	Tsukuba University	HB Solution	KRISS

2. Theory and Simulation

Prof.  Aleksander Jablonski	Dr.  HIroshi Shinotsuka	Dr.  Samuel Bertolini Da Silva Oliveira	Prof.  Yongho Seo
Parameters Needed for Simulations of Electron Transport in Condensed Matter	Innovative Sample Structure Prediction using Bayesian Estimation and XPS Simulator	Molecular Dynamics Simulations of Gas Cluster Induced Protein Desorption, Transfer and Soft/reactive Landing	Smart Algorithm for Three-Dimensional AFM Imaging of High Aspect Ratio Nanostructures
Polish Academy of Sciences	National Institute for Materials Science (NIMS)	Université catholique de Louvain	Sejong University
Prof.  Manhee Lee
Nondestructive Nanoscopy through Bifurcation-Controlled Nonlinear Dynamics of Micro-Cantilever
Chungbuk National University

3. Data Analysis and Treatment

Dr.  Alex Henderson	Prof. Dr.  Sven Tougaard	Prof.  Satoka AOYAGI	Prof.  Satoshi TOYODA
Towards a Common Data File Format for Hyperspectral Images	XPS/HAXPES, and NAP-XPS, for Characterization of Nano-Structured Materials	Data-driven Analysis of Spectrum and Image Data	Towards Advanced Interface Visualization in Multi Layer Stacks: Big Data and Simulation Approaches Using Angle-resolved XPS
The University of Manchester	University of Southern Denmark	Seikei University	Scienta Omicron Japan
Dr.  Sang-Joon Cho
Transformative Data Insights: Advanced Hybrid Nano-Metrology for High-Resolution Material Characterization
Park Systems

4. Novel Techniques and Instrument

Dr.  Chales Clifford	Prof.  John Sader	Prof.  Si-Young Choi	Prof.  Young-Min Kim
Scanning Probe Microscopy: from Research to International Standards	Suspended Microchannel Resonators	Electron Microscopic Understanding toward Highly-Performed Cathode	Machine Learning-assisted Electron Spectroscopic Imaging for Chemical Analysis of Energy-related Materials
NPL	Caltech	POSTECH	Sungkyunkwan University

5. Applications I (Device and Materials)

Dr.  Richard Morris	Dr.  Dongchul Ihm	Dr.  Wooyoung Jung
Atom Probe Tomography: Application and Challenges within the Semiconductor Field	Advancements and Challenges in Surface Metrology and Inspection for the 3D Integration Era	Innovative Applications of Surface Analysis for 3D Semiconductor Structures
IMEC	Samsung Electronics	SK hynix

6. Applications II (Energy)

Mr.  Takahiro Suzuki	Mr.  Masahiro Terashima	Prof.  Yun Jeong Hwang	Prof. Hyun-Wook Lee
Investigation on XPS Charge Neutralization Method for Carbon-Based Battery Materials	Chemical State and Energy Band Structure Analysis for Interface Modification in All-Solid-State Battery Materials	Understanding the electrochemical active sites during electrochemical electro-oxidation reaction of biomass upgrading	Observation of the Nucleation and Growth of Lithium Metal Dodecahedra in Anode-free Lithium Batteries
Cataler Corporation	ULVAC PHI	Seoul National University	Ulsan National Institute of Science and Technology

7. Applications III (Bio and Organics)

Prof.  Jaekyung Hyun	Dr.  HeeJin Lim	Jun-ichiro SAMESHIMA	Dr.  Tanguy Terlier
Unraveling of Complex Poxvirus Structure using Cryo-Electron Microscopy	Time-of-flight Secondary Ion Mass Spectrometry Imaging of Biological Samples	Mass Imaging Analyses for Practically Utilized Polymers and Bio Materials	Multiplexing Analysis Using Microarray by ToF-SIMS: a High Throughput Exploration Tool for Rapid Chemical Screening
Sungkyunkwan University	Korea Basic Science Institute (KBSI)	Toray Research Center, Inc.	Rice University

8. Electron Spectroscopy

Prof.  Yeonjin Yi	Dr.  Kyung-Tae Ko	Dr.  Jeongjin Kim
Electronic Structure of Halide Perovskites: Insights from Photoelectron Spectroscopy Measurement Techniques	Investigation on Electronic Structure of Exotic Layered Chalcogenide Materials	Probing the Surface Electronic Structure and Reaction Intermediate using Synchrotron-Based AP-XPS
Yonsei University	Korea Basic Science Institute	Pohang Accelerator Laboratory, POSTECH

9. Electron Microscopy

Dr.  Sung-Dae Kim	Prof.  Young Heon Kim	Prof.  Youngung Jeong
Understanding Dislocation Dynamics in Advanced Steels via Transmission Electron Microscopy	In situ and Operando Transmission Electron Microscopy Study of One-dimensional InAs-based Compound Semiconductor Nanowires	Recent advancements in elasto-visco-plastic self-consistent model and its application to various polycrystal metals
Pukyong National University	Chungnam National University	Changwon National University

10. Ion Beam Technology

Dr.  Kyeryung Kim	Dr.  Yun Jung Jang
Status and Utilization of Tandem Accelerator-Based Ion Beam Analysis System of KAERI	Compositional and Interfacial Analysis of Ag incorporated CIGS Solar Cell using SIMS, AES and APT
Korea Atomic Energy Research Institute	Korea Institute of Science and Technology

11. Photon Beam Technology

Prof.  Un Jeong Kim	Dr.  Sooji Nam	Prof.  Seokjoon Yun	Prof.  Jung hwa Seo
Optical Properties of Low Dimenstional investigated by Light-Matter Interactions	Analysis of Tellurium/Indium Zinc Tin Oxide Heterostructures and Their Device Applications	Bottom-up Synthesis of 2D Materials for Future Electronics	Photoelectron Spectroscopic Study of the Interfacial Electronic Structures of Metal-Ion Containing Polyelectrolytes on ITO Substrates
Dongguk University	Electronics and Telecommunications Research Institute	University of Ulsan	University of Seoul
Dr.  Chaejeong Heo	Prof.  Kwangseuk Kyhm
Label-free Spectroscopic Detection of Biomolecules for Diagnosing Alzheimer’s Disease	Ultrafast Spectroscopy and Microscopy on Nanostructures
Sungkyunkwan University	Pusan National University

12. NSSK

Prof.  Yunseok Kim	Prof.  Jungchul Lee	Dr.  Dong Hyeon Kim	Dr.  Junghoon Jahng
Improved Sensitivity of Atomic force Microscopy Images by Machine Learning	Unconventional Micro-/Nanofabrication via High Temperature Annealing	The Nanoscale Lattice Deformations in Two-dimensional Materials	Advances and Challenges in Dynamic Photo-induced Force Microscopy
Sungkyunkwan University	Korea Advanced Institute of Science and Technology	Hanyang University	Korea Research Institute of Standards and Science
Prof.  Young-Jun Yu	Dr.  Eunpa Kim	Prof.  Sangmin An	Prof.  Manhee Lee
Charge Trapping Memory Based on 2D Materials Heterostructures	The Present and Future of Scanning Probe Technology for Advanced Semiconductor Device Manufacturing	Atomic Force Microscope-based Analysis of the Nanoscale Materials and Fabrication of the Microscale Probes	Quartz tuning fork-based microviscometry for selecting high-quality sperm from semen
Chungnam National University	SAMSUNG ELECTRONICS	Jeonbuk National University	Chungbuk National University