제3회 종합학술대회 초청연사

A. Electron Spectroscopy (Nov. 19 (Tue), 2024)

Yeonjin Yi	Kyung-Tae Ko	Jeongjin Kim
Electronic Structure of Halide Perovskites: Insights from Photoelectron Spectroscopy Measurement Techniques	Investigation on Electronic Structure of Exotic Layered Chalcogenide Materials	Probing the Surface Electronic Structure and Reaction Intermediate using Synchrotron-Based AP-XPS
Yonser University	Korea Basic Science Institute	Pohang Accelerator Laboratory, POSTECH

B. Electron Microscopy (Nov. 19 (Tue), 2024)

Sung-Dae Kim	Young Heon Kim	TBD
Understanding dislocation dynamics in advanced steels via transmission electron microscopy	In situ and operando transmission electron microscopy study of one-dimensional InAs-based compound semiconductor nanowires
Pukyong National University	Chungnam National University

C. Ion Beam Technology (Nov. 19 (Tue), 2024)

Kyeryung Kim	Seong Jun Kim	Jang Yun Jung
Status and Utilization of Tandem Accelerator-Based Ion Beam Analysis System of KAERI		Effect of Ag incorporation on CIGS solar cells using surface analytical techniques
Korea Atomic Energy Research Institute	Korea Basic Science Institute	Korea Institute of Science and Technology

D. Photon Beam Technology (Nov. 20 (Wed), 2024)

Un Jeong Kim	Sooji Nam	Seokjoon Yun
Optical Properties of Low Dimenstional investigated by Light-Matter Interactions	Analysis of Tellurium/Indium Zinc Tin Oxide Heterostructures and Their Device Applications	Bottom-up synthesis of 2D materials for future electronics
Dongguk University	Electronics and Telecommunications Research Institute	University of Ulsan

Jung hwa Seo	Chaejeong Heo	Kwangseuk Kyhm
Photoelectron Spectroscopic Study of the Interfacial Electronic Structures of Metal-Ion Containing Polyelectrolytes on ITO Substrates	Label-free spectroscopic detection of biomolecules for diagnosing Alzheimer’s disease	Ultrafast spectroscopy and Microscopy on Nanostructures
University of Seoul	Sungkyunkwan University	Pusan National University

PSA-24 Invited Speakers

Plenary Lectures

Dr.  Donald Baer	Prof.  Ian Gilmore	Dr.  Sung-Chan Jo
A perspective on XPS challenges, needs and opportunitie	Evolution and revolution in secondary ion mass spectrometry	Advanced Surface Analysis for the Perspective in Display/Semiconductor Industry
Pacific Northwest National Laboratory	National Physical Laboratory (NPL)	Samsung Display

1. Standardization and Pre-standardization

Dr.  David Cant	Prof.  Hidehiko NONAKA	Dr.  Wonja Min	Dr.  Seung Mi Lee
A Roadmap to HAXPES Standardisation	Standardization Activities in ISO TC 201 (Surface Chemical Analysis)	Standardization of Medium Energy Ion Scattering Spectrometry	Quantitative Analysis of Binary Alloy Films by Surface Analysis Methods in CCQM-SAWG
National Physical Laboratory	Tsukuba University	HB Solution	KRISS

2. Theory and Simulation

Prof.  Aleksander Jablonski	Dr.  HIroshi Shinotsuka	Dr.  Samuel Bertolini Da Silva Oliveira	Prof.  Yongho Seo
Parameters needed for simulations of electron transport in condensed matter	Innovative Sample Structure Prediction using Bayesian Estimation and XPS Simulato	TBD	Smart Algorithm for Three-Dimensional AFM Imaging of High Aspect Ratio Nanostructures
Polish Academy of Sciences	National Institute for Materials Science (NIMS)	Université catholique de Louvain	Sejong University
Prof.  Manhee Lee
Nondestructive Nanoscopy through Bifurcation-Controlled Nonlinear Dynamics of Micro-Cantilever
Chungbuk National University

3. Data Analysis and Treatment

Dr.  Alex Henderson	Prof. Dr.  Sven Tougaard	Prof.  Satoka AOYAGI	Prof.  Satoshi TOYODA
Towards a common data file format for hyperspectral images	XPS/HAXPES, and NAP-XPS, for Characterization of Nano-Structured Materials	Data-driven analysis of spectrum and image data	Towards advanced interface visualization in multi layer stacks: Big data and and simulation approaches using angle-resolved XPS
The University of Manchester	University of Southern Denmark	Seikei University	Scienta Omicron Japan
Dr.  Sang-Joon Cho
Transformative Data Insights: Advanced Hybrid Nano-Metrology for High-Resolution Material Characterization
Park Systems

4. Novel Techniques and Instrument

Dr.  Chales Clifford	Prof.  John Sader	Prof.  Si-Young Choi	Prof.  Young-Min Kim
Scanning probe microscopy: from research to international standards	Suspended microchannel resonators	TBD	Machine learning-assisted electron spectroscopic imaging for chemical analysis of energy-related materials
NPL	Caltech	POSTECH	Sungkyunkwan University

5. Applications I (Device and Materials)

Dr.  Richard Morris	Dr.  Dongchul Ihm	Dr.  Wooyoung Jung
Atom probe tomography: Application and challenges within the semiconductor field	Advancements and Challenges in Surface Metrology and Inspection for the 3D Integration Era	Innovative Applications of Surface Analysis for 3D Semiconductor Structures
IMEC	Samsung Electronics	SK hynix

6. Applications II (Energy)

Dr.  Yige Sun	Mr.  Takahiro Suzuki	Mr.  Masahiro Terashima	Prof.  Yun Jeong Hwang
Mapping Li concentration gradients across battery cathodes	Investigation on XPS Charge Neutralization Method for Carbon-Based Battery Materials	Chemical state and energy band structure analysis for interface modification in All-Solid-State Battery materials.	Understanding the electrochemical active sites during electrochemical electro-oxidation reaction of biomass upgrading
University of Oxford	Cataler Corporation	ULVAC PHI	Seoul National University
Prof. Hyun-Wook Lee
Observation of the Nucleation and Growth of Lithium Metal Dodecahedra in Anode-free Lithium Batteries
UNIST

7. Applications III (Bio and Organics)

Prof.  Jaekyung Hyun	Dr.  HeeJin Lim	Jun-ichiro SAMESHIMA	Dr.  Tanguy Terlier
Unraveling of Complex Poxvirus Structure using Cryo-Electron Microscopy	Time-of-flight secondary ion mass spectrometry imaging of biological samples	TBD	Multiplexing analysis using microarray by ToF-SIMS: a high throughput exploration tool for rapid chemical screening
Sungkyunkwan University	Korea Basic Science Institute (KBSI)	TRC	Rice University