Plenary Lectures

PL1		Name	Dr. Donald Baer
		Title	A perspective on XPS challenges, needs and opportunitie
		Affiliation	Pacific Northwest National Laboratory

PL2		Name	Prof. Ian Gilmore
		Title	Evolution and revolution in secondary ion mass spectrometry
		Affiliation	National Physical Laboratory (NPL)

PL3		Name	Dr. Sung-Chan Jo
		Title	Advanced Surface Analysis for the Perspective in Display/Semiconductor Industry
		Affiliation	Samsung Display

1.Standardization and Pre-standardization

	Name	Dr. David Cant
	Title	A Roadmap to HAXPES Standardisation
	Affiliation	National Physical Laboratory

	Name	Prof. Hidehiko NONAKA
	Title	Standardization Activities in ISO TC 201 (Surface Chemical Analysis)
	Affiliation	Tsukuba University

	Name	Dr. Wonja Min
	Title	TBD
	Affiliation	HB Solution

	Name	Dr. Seung Mi Lee
	Title	TBD
	Affiliation	KRISS

2. Theory and Simulation

	Name	Prof. Aleksander Jablonski
	Title	Parameters needed for simulations of electron transport in condensed matter
	Affiliation	Polish Academy of Sciences

	Name	Dr. HIroshi Shinotsuka
	Title	Innovative Sample Structure Prediction using Bayesian Estimation and XPS Simulato
	Affiliation	National Institute for Materials Science (NIMS)

	Name	Prof. Yongho Seo
	Title	TBD
	Affiliation	Sejong University

	Name	Prof. Manhee Lee
	Title	Nondestructive Nanoscopy through Bifurcation-Controlled Nonlinear Dynamics of Micro-Cantilever
	Affiliation	Chungbuk National University

3. Data Analysis and Treatment

	Name	Dr. Alex Henderson
	Title	TBD
	Affiliation	The University of Manchester

	Name	Prof. Dr. Sven Tougaard
	Title	HAXPES for characterization of nanostructured materials
	Affiliation	University of Southern Denmark

	Name	Prof. Satoka AOYAGI
	Title	Data-driven analysis of spectrum and image data
	Affiliation	Seikei University

	Name	Prof. Satoshi TOYODA
	Title	Towards advanced interface visualization in multi layer stacks: Big data and and simulation approaches using angle-resolved XPS
	Affiliation	Scienta Omicron Japan

	Name	Dr. Sang-Joon Cho
	Title	TBD
	Affiliation	Park Systems

4. Novel Techniques and Instrument

	Name	Dr. Chales Clifford
	Title	TBD
	Affiliation	TBD

	Name	Prof. John Sader
	Title	TBD
	Affiliation	Caltech

	Name	Prof. Si-Young Choi
	Title	TBD
	Affiliation	POSTECH

	Name	Prof. Young Min Kim
	Title	Machine learning-assisted electron spectroscopic imaging for chemical analysis of energy-related materials
	Affiliation	Sungkyunkwan University

5. Applications I (Device and Materials)

	Name	Dr. Richard Morris
	Title	Atom probe tomography: Application and challenges within the semiconductor field
	Affiliation	IMEC

	Name	Dr. Dongchul Ihm
	Title	TBD
	Affiliation	Samsung Electronics

	Name	Dr. Wooyoung Jung
	Title	Innovative Applications of Surface Analysis for 3D Semiconductor Structures
	Affiliation	SK hynix

6. Applications II (Energy)

	Name	Dr. Yige Sun
	Title	Visualization of lithium-ion gradient for lithium-ion battery electrodes with different hysteresis using secondary ion mass spectrometry
	Affiliation	University of Oxford

	Name	Mr. Takahiro Suzuki
	Title	Investigation on XPS Charge Neutralization Method for Carbon-Based Battery Materials
	Affiliation	Cataler Corporation

	Name	Mr. Masahiro Terashima
	Title	Interface analysis of chemical state and energy band structure for enhancing the performance of All-Solid-State Battery materials
	Affiliation	ULVAC PHI

	Name	Prof. Yun Jeong Hwang
	Title	Understanding the electrochemical active sites during electrochemical electro-oxidation reaction of biomass upgrading
	Affiliation	Seoul National University

	Name	Prof. Hyun-Wook Lee
	Title	Observation of the Nucleation and Growth of Lithium Metal Dodecahedra in Anode-free Lithium Batteries
	Affiliation	UNIST

7. Applications III (Bio and Organics)

	Name	Prof. Jaekyung Hyun
	Title	Unraveling of Complex Poxvirus Structure using Cryo-Electron Microscopy
	Affiliation	Sungkyunkwan University

	Name	Dr. HeeJin Lim
	Title	Time-of-flight secondary ion mass spectrometry imaging of biological samples
	Affiliation	Korea Basic Science Institute (KBSI)

	Name	Dr. Tanguy Terlier
	Title	Multiplexing analysis using microarray by ToF-SIMS: a high throughput exploration tool for rapid chemical screening
	Affiliation	Rice University